A topological data analysis based classification method for multiple measurement
Henri Riihimäki, Wojciech Chachólski, Jakob Theorell, Jan A. Hillert, Ryan Ramanujam
This paper introduces a topological data analysis classifier for repeated measurements, achieving high accuracy in two case studies and demonstrating its utility as a feature selection tool.
BMC Bioinformatics · Jul 29, 2020Peer-reviewedBioinformatics