Exploring the potential for scanning electron microscopy/focused ion beam - based diffraction for screening cryo-transmission electron microscopy samples
Eric Woods, Christoph Wigge, Yujun Zhao, René de Kloe, Tim M. Schwarz, T. Ben Britton, Stefan Zaefferer, Baptiste Gault
The paper proposes using electron backscatter diffraction in a cryo-SEM to assess ice crystallinity in cryo-TEM samples before preparation, enabling better targeting of sample preparation steps.
bioRxiv · Sep 25, 2025 · PreprintMolecular Biology