Characterizing nanometric thin films with far-field light
H. Klimovsky, O. Shavit, C. Julien, I. Olevsko, M. Hamode, Y. Abulafia, H. Suaudeau, V. Armand, M. Oheim, A. Salomon
This paper introduces an optical technique to measure refractive index, thickness, and homogeneity of nanometric transparent films using supercritical angle fluorescence.
bioRxiv · Aug 15, 2022 · PreprintBiophysics