SS-Detect: Development and Validation of a New Strategy for Source-Based Morphometry in Multi-Scanner Studies
Ruiyang Ge, Shiqing Ding, Tyler Keeling, William G. Honer, Sophia Frangou, Fidel Vila‐Rodriguez
SS-Detect improves source-based morphometry in multi-scanner studies by detecting both common and scanner-specific brain patterns with higher accuracy and sensitivity than conventional methods.
Journal of Neuroimaging · Dec 3, 2020Peer-reviewedBioinformatics