GeneticsThe Plant GenomePeer-reviewed
Multi-Trait Machine and Deep Learning Models for Genomic Selection using Spectral Information in a Wheat Breeding Program
Karansher Singh Sandhu, Shruti Sunil Patil, Michael Pumphrey, Arron Hyrum Carter
This study uses multi-trait machine and deep learning models with spectral data to improve genomic selection predictions for grain yield and protein content in wheat.
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