Enhanced 2D structured illumination microscopy: super-resolution with optical sectioning and reduced reconstruction artifacts

Abstract

Structured Illumination Microscopy (SIM) provides imaging with spatial super-resolution, as well as optical sectioning capability, without relying on specialized fluorescent dyes. 2D and 3D variants of this method exist, but most bespoke implementations are 2D-SIM, because it is easier to realize and modify than 3D-SIM. 2D-SIM systems, however, often experience reconstruction artifacts from out-of-focus contributions, especially when pushing for high lateral spatial resolution in thicker samples. We present enhanced 2D-SIM, an approach to 2D-SIM where both, coarse patterns optimized for removing out-of-focus background, and fine patterns optimized for resolution improvement beyond the diffraction limit are used. In combination, this achieves 2D-SIM reconstructions with high contrast, spatial super-resolution, and significantly reduced reconstruction artifacts. We present the theoretical framework of this technique, and provide enhanced 2D-SIM imaging results of liver sinusoidal endothelial cells stained with fluorophores emitting at visible and near-infrared wavelengths. Quantitative comparisons of power spectral distribution and image resolution are demonstrated.