A Combinatorial Approach of Biparental QTL Mapping and Genome-Wide Association Analysis Identifies Candidate Genes for Phytophthora Blight Resistance in Sesame

Phytophthora blight, caused by pathogen Phytophthora nicotianae, is responsible for a huge reduction in sesame (Sesamum indicum L.) crop yields. In this study, we utilized a combinatorial approach involving biparental QTL mapping and genome-wide association (GWAS) analysis to identify genes associated with Phytophthora blight resistance in sesame. Evaluation of resistant of the parental varieties (Goenbaek, Osan and Milsung) and the RILs of both the populations in greenhouse conditions suggested the qualitative nature of the trait.. The genetic map comprised thirteen LGs covering a total map length of 887.49 cM with an average inter-marker distance of 4.69 cM. Significant QTLs explaining phenotypic variation in the range of 2.25% to 69.24% were identified on chromosomes 10 and 13 (Chr10 and Chr13). A resistance locus detected on Chr10 was found to be highly significant. The association of this locus to PBR was also identified through BSA and single marker analysis in Goenbaek x Milsung cross and through genome-wide association mapping of 87 sesame accessions. The GWAS analysis identified 44 SNP loci significantly associated with Phytophthora disease-resistant traits on Chr10. Further, the haplotype block analysis conducted in order to find whether the SNPs associated with resistance in this study showed that the SNPs are in high LD with the resistance QTL. We obtained a total of 68 candidate genes, which included a number of defense-related R genes. One of the genes, SIN_1019016 (At1g58390) showed high expression in the resistant parent. The results from this study would be highly useful in identifying genetic and molecular factors associated with Phytophthora blight resistance in sesame.