Separate-scan atomic force microscope for fast infrared scattering-type scanning near-field optical microscope
Yusuke Sakiyama, Santiago H. Andany, Georg Ernest Fantner, Joachim Heberle
The paper introduces a separate-scan AFM system integrated with BI-sSNOM to enable faster imaging of biomolecules in aqueous solutions.
Measurement Science and Technology · Jan 19, 2026Peer-reviewedBiophysics