Within Visit Test-Retest Reliability of EEG Profiles in Children with Autism Spectrum Disorder and Typical Development
April R. Levin, Adam J. Naples, Aaron Wolfe Scheffler, Sara Jane Webb, Frederick Shic, Catherine A. Sugar, Michael Murias, Raphael Bernier, Katarzyna Chawarska, Géraldine Dawson, Susan Faja, Shafali Jeste, Charles A. Nelson, James C. McPartland, Damla Şentürk
The paper assesses the test-retest reliability of EEG PSD profiles in children with ASD and TD controls using two analytical approaches, showing stable individual signatures across sessions.
Frontiers in Integrative Neuroscience · Apr 30, 2020Peer-reviewedNeuroscience