Single particle cryo-electron microscopy with an enhanced 200 kV cryo-TEM configuration achieves near-atomic resolution
L. Jia, E. E. Ruben, H. J. Suarez, S. K. Olsen, E. V. Wasmuth
This study shows that a 200 kV cryo-TEM with advanced detectors can achieve near-atomic resolution for single particle cryo-EM, comparable to 300 kV systems.
bioRxiv · May 7, 2024 · PreprintBiophysics