Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy
R. Lane, Y. Vos, A. H. Wolters, L. van Kessel, B. N. G. Giepmans, J. P. Hoogenboom
This study optimizes negative stage bias potential to improve imaging speed in large-scale electron microscopy by reducing dwell time and enhancing image quality and signal-to-noise ratio.
bioRxiv · Sep 3, 2020Cell Biology