Integrative network modeling reveals mechanisms underlying T cell exhaustion
Hamid Bolouri, Mary H. Young, Joshua N. Beilke, Rebecca Johnson, Brian A. Fox, Lu Huang, Cristina Costa Santini, Christopher Mark Hill, Anne-Renée Van der Vuurst de Vries, Paul T. Shannon, Andrew Dervan, Pallavur V. Sivakumar, Matthew W. B. Trotter, Douglas E. Bassett, Alexander V. Ratushny
The paper uses network modeling to identify molecular mechanisms driving T cell exhaustion and validates predictions through experimental testing.
Scientific Reports · Feb 5, 2020Peer-reviewedSystems Biology