Fully automated, sequential focused ion beam milling for cryo-electron tomography
Tobias Zachs, Andreas Schertel, João M. Medeiros, Gregor L. Weiss, Jannik Hugener, Joao Matos, Martin Pilhofer
This paper describes an automated method for preparing cryoET samples, reducing preparation time and user input while enabling high-quality lamellae for imaging and subtomogram averaging.
eLife · Mar 9, 2020Peer-reviewedMolecular Biology