Leonardo: a toolset to correct sample-induced artifacts in light sheet microscopy images
Yu LiuiD, Gesine F. Müller, Lennart Kowitz, Tomáš ChobolaiD, Kurt R. WeissiD, Paul Maier, Jie Luo, Malte RoeßingiD, Martin Stenzel, Anika GrüneboomiD, Johannes Christian PaetzoldiD, Ali ErtürkiD, Nassir NavabiD, Carsten MarriD, Jianxun CheniD, Jan HuiskeniD, Tingying PengiD
Abstract
Selective plane illumination microscopy (SPIM, also known as light sheet fluorescence microscopy) is the method of choice for studying morphogenesis and function in biological specimens over extended periods, as it permits gentle and rapid volumetric imaging. In inhomogeneous samples, however, sample-induced artifacts, including light absorption, scattering, and refraction, can impact the image quality, particularly as the focal plane gets deeper into the sample. Here, we present Leonardo, the first toolbox designed to address the major sample-induced artifacts by using two modules: (1) DeStripe removes stripe artifacts in SPIM caused by light absorption while preserving fine sample structures; (2) Fuse reconstructs a single high-quality image from dualsided illumination and/or dual-sided detection, while eliminating blur and optical distortions caused by light scattering and refraction. The efficacy of Leonardo is validated on a wide range of biological samples, from minimally invasive experiments on sensitive specimens (translucent embryonic and optically opaque larval zebrafish) to cleared mouse samples up to two centimeters in size. We provide model code and a Napari-based graphical user interface, enabling the SPIM community to easily apply Leonardo to advance light sheet imaging of inhomogeneous and complex specimens.
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