Fast imaging of millimeter-scale areas with beam deflection transmission electron microscopy
Zhihao Zheng, Christopher S. Own, Adrian Andreas Wanner, Randal A. Koene, Eric W. Hammerschmith, William Silversmith, Nico Kemnitz, Ran Lu, David W. Tank, H. Sebastian Seung
This paper improves TEM imaging speed by using beam deflection to capture multiple image tiles, increasing efficiency for millimeter-scale brain tissue imaging.
Nature Communications · Aug 10, 2024Peer-reviewedNeuroscience