Author

Benjamin Offei

University College DublinORCID 0000-0002-8283-103XUnclaimed ORCID profile · follow to get notified of new preprints

Biology Disciplines

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Signature Assays, Organisms & Methods

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Research Focus:benchmarking· 1 Research Focus:genome assembly· 1 Approach:statistical model· 1 Research Focus:variant calling· 1 Assay:whole-genome sequencing· 1 Organism:yeast· 1

Frequent Co-Authors

Aisling Y. CoughlaniD· 1 shared Alexander DouglassiD· 1 shared Caoimhe E. O’BrieniD· 1 shared Geraldine ButleriD· 1 shared Kenneth H. WolfeiD· 1 shared Kevin P. ByrneiD· 1 shared Raúl A. Ortiz‐MerinoiD· 1 shared

Activity by Year

2019-2019 · peak 1/yr

Co-Author Collaboration Network

7 top collaborators · 21 mutual co-author links

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1 shared paperGenomics

Aisling Y. CoughlanORCID

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1 paper

Recent·Most cited

Coverage-versus-Length plots, a simple quality control step for de novo yeast genome sequence assemblies

Alexander Douglass, Caoimhe E. O’Brien, Benjamin Offei, Aisling Y. Coughlan, Raúl A. Ortiz‐Merino, Geraldine Butler, Kevin P. Byrne, Kenneth H. Wolfe

The paper introduces Coverage-versus-Length plots to assess de novo yeast genome assemblies, identifying contaminants and atypical scaffolds through coverage and length analysis.

G3 Genes Genomes Genetics · Jan 23, 2019Peer-reviewedGenomics