Characterization of the nanomechanical properties of the fission yeast (Schizosaccharomyces pombe) cell surface by atomic force microscopy

Abstract

Variations in cell wall composition and biomechanical properties can contribute to the cellular plasticity required during complex processes such as polarized growth and elongation in microbial cells. This study utilizes atomic force microscopy (AFM) to map the cell surface topography of fission yeast, Schizosaccharomyces pombe, at regions of active polarized growth and to characterize the biophysical properties within these regions under physiological, hydrated conditions. High-resolution images acquired from AFM topographic scanning reveal decreased surface roughness at actively growing cell poles. Force extension curves acquired by nanoindentation probing with AFM cantilever tips under low applied force revealed increased cell wall elasticity and decreased cellular stiffness (cellular spring constant) at cell poles (17 {+/-} 4 mN/m) relative to the main body of the cell that is not undergoing growth and expansion (44 {+/-} 10 mN/m). These findings suggest that the increased elasticity and decreased stiffness at regions undergoing polarized growth at fission yeast cell poles provide the plasticity necessary for cellular extension. This is the first direct biophysical characterization of the S. pombe cell surface by AFM, and it provides a foundation for future investigation of how the surface topography and local nanomechanical properties vary during different cellular processes.