Quantifying the mechanical properties of yeast Candida albicans using atomic force microscopy-based force spectroscopy
C. R. Jones, Z. J. Zhang, H.-J. Tsai
The paper describes a label-free atomic force microscopy method to measure the physical properties of Candida albicans in response to host stress and antifungal drugs.
bioRxiv · Oct 7, 2022 · PreprintMicrobiology