Patrick Cleeve

This paper introduces Adaptive Polishing, a machine learning-driven method for improving the consistency and thinness of cryo-lamellae during focused ion beam milling.

This paper introduces curved and corrugated cryo-lamella designs to improve mechanical resilience and reduce lamella loss during electron microscopy sample preparation.

This paper introduces two fluorescence-guided cryo-FIB milling workflows to improve targeting accuracy for cryo-ET, enabling routine capture of structures across spatial scales.

This paper introduces two modifications to cryo-lamella preparation to reduce crack formation and improve mechanical resistance during imaging.

The paper introduces a modification to cryo-FIB milling patterns by adding fillets to reduce stress concentration and lamella breakage, improving yield by 33%.