A Wide-Field Micro-Computed Tomography Detector: Micron Resolution at Half-centimeter Scale
Maksim A. YakovleviD, Daniel J. VanselowiD, Mee S. NguiD, Carolyn R. ZainoiD, Spencer R. KatziD, Yifu DingiD, Dula ParkinsoniD, Steve Yuxin Wang, Khai Chung AngiD, Patrick J. La RivièreiD, Keith C. ChengiD
Abstract
Ideal 3-dimensional imaging of many complex samples, such as biological tissues made up of micro-scale structures extending over millimeter- to centimeter-scale tissue samples and organisms, requires both a wide field-of-view and high resolution. With existing optics and detectors used for micro-CT imaging, sub-micron pixel resolution can only be achieved for fields-of-view of <2 mm. This manuscript presents a unique detector system with a 6-mm field-of-view image circle and 0.5 m pixel size that can be used in both synchrotron facilities and tabletop micro-CT units. A resolution-test pattern with linear microstructures and whole adult Daphnia magna were imaged on Beamline 8.3.2 of the Advanced Light Source. Volumes of 10,000 x 10,000 x 7,096 isotropic 0.5 m voxels were reconstructed over a 5.0 x 3.5 mm field-of-view. Measurements in the projection domain confirmed a 1.182 m measured spatial resolution that is largely Nyquist-limited. This unprecedented combination of field-of-view and resolution dramatically reduces the need for sectional scans and computational stitching for large samples, ultimately offering the means to elucidate change in tissue and cellular morphology in the context of larger whole, intact model organisms and specimens. This development is also anticipated to benefit micro-CT imaging in materials science, microelectronics, agricultural science, and biomedical engineering. SynopsisA custom wide-field lens and a new-generation megapixel camera enabled microCT scanning over a 3.5 x 5 mm field-of-view at a 1 m resolution / 0.5 m pixel size at the Berkeley Lawrence Advanced Light Source using a phantom with micron scale features. This novel combination of resolution and field-of-view will be broadly applicable to any setting in which micron-scale structures need to be characterized comprehensively in 3 dimensions over mm to cm scale.
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