A method to minimize condenser lens-induced hysteresis effects in a JEOL JEM-3200FSC microscope to enable stable cryoEM low-dose operations

Low dose imaging procedures are key for a successful cryoEM experiment (whether by electron cryotomography, single particle analysis, electron crystallography, or MicroED). We present a method to minimize magnetic hysteresis of the condenser lens system in the JEOL JEM-3200FSC transmission electron microscope (TEM) in order to maintain a stable optical axis for the beam path of low-dose imaging. The simple procedure involves independent voltage ramping of the CL1 and CL2 lenses immediately before switching to the focusing and exposure beam settings for data collection.\n\nHighlights O_LIEnables consistent horizontal beam position during low-dose mode switching\nC_LIO_LIFacilitates EM automated data collection for the JEOL JEM-3200FSC\nC_LIO_LIImproves beam stability in both TEM imaging and diffraction modes\nC_LI