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Molecular BiologybioRxiv
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High-resolution spatial profiling identifies disease-specific molecular architecture in palmoplantar pustulosis

Kazuki YatsuzukaiD, Jun MutoiD, Yoichi MizukamiiD, Keishiro IsayamaiD, Daisuke ShiokawaiD, Mei Miyazaki, Teruko Tsuda, Ken ShiraishiiD, Yasuhiro FujisawaiD, Masamoto MurakamiiD

Abstract

Palmoplantar pustulosis (PPP) and dyshidrotic eczema (DE) are chronic vesiculopustular dermatoses with overlapping clinical presentations but distinct underlying biology. Although comparative transcriptomic and proteomic analyses between PPP and DE have been reported, they remain limited in number and scope, with no comprehensive understanding of their distinct molecular signatures. Moreover, their molecular mechanisms remain unclear, and currently available therapeutic options are limited. To clarify disease-specific epidermal programs underlying vesicle formation, we conducted Visium HD spatial transcriptomic analysis of FFPE lesional skin samples obtained from patients with PPP and DE, followed by immunohistochemical validation against normal palmoplantar skin controls. Spatial clustering identified a keratinocyte subpopulation adjacent to vesicles that exhibited distinct transcriptional programs in the two diseases. In PPP, vesicle-associated keratinocytes demonstrated marked downregulation of aquaporin-3 (AQP3) and E-cadherin, together with strong, spatially localized activation of JAK-STAT3 signaling. Conversely, DE exhibited diffuse AQP3 expression and more homogeneous activation of JAK-STAT3 signaling throughout the epidermis. These results indicate that, although PPP and DE share inflammatory pathways, they differ substantially in their spatial molecular architecture. Reduced AQP3 expression and localized STAT3 activation may contribute to vesicle formation in PPP, supporting our previous hypothesis that implicates intraepidermal sweat leakage as a pathogenic mechanism in PPP. O_FIG O_LINKSMALLFIG WIDTH=200 HEIGHT=130 SRC="FIGDIR/small/723901v1_ufig1.gif" ALT="Figure 1"> View larger version (48K): org.highwire.dtl.DTLVardef@72a341org.highwire.dtl.DTLVardef@3c0beaorg.highwire.dtl.DTLVardef@325098org.highwire.dtl.DTLVardef@1493ebf_HPS_FORMAT_FIGEXP M_FIG C_FIG

02 /Specification & Classification

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