Approaching Maximum Resolution in Structured Illumination Microscopy via Accurate Noise Modeling
A. Saurabh, P. T. Brown, J. S. Bryan, Z. R. Fox, R. Kruithoff, C. Thompson, C. Kural, D. P. Shepherd, S. P. Presse
This paper introduces B-SIM, an unsupervised Bayesian framework for structured illumination microscopy that improves resolution and contrast by accurately modeling noise, outperforming existing methods in both simulated and experimental data.
bioRxiv · Dec 7, 2023Biophysics